Oral Presentation International Conference on Tomography of Materials & Structures

Edge illumination x-ray phase tomography (203)

Peter Munro 1
  1. University College London, Surbiton, SURREY, United Kingdom

Edge illumination x-ray phase tomography acquires three-dimensional images of both the real andimaginary parts of the sample refractive index. This is important because significant contrast is contained inthe real part and it is invisible to conventional x-ray computed tomography. The edge illumination method canbe implemented with conventional x-ray sources making it well suited to real world applications

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