Keynote International Conference on Tomography of Materials & Structures

Multiple modal X-ray microtomography at SSRF (120)

Tiqiao Xiao 1
  1. Shanghai Synchrotron Radiation Facility/Zhangjiang Lab, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Pudong New District, SHANGHAI, China

Conventional X-ray microtomography is based on absorption contrast and limited on microstructure analysis. With the combination of absorption/phase contrast and fluorescence, diffraction, scattering information, X-ray microtomography is capable for nondestructive and quantitative investigation on microstructures and components of low Z and high Z materials, elements distribution, crystal grain distribution and orientation, nano particle distribution and morphology.

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