Poster Presentation International Conference on Tomography of Materials & Structures

Grazing incidence X-ray ptychography for in situ studies of thin sub-monolayer films of nanoparticles. (129)

Azat M Slyamov 1 , Peter S Jørgensen 1 , Christian Rein 1 , Michal Odstrčil 2 , Jens W Andreasen 1
  1. Technical University of Denmark, Roskilde, Denmark
  2. Paul Scherrer Institut, Villigen, Switzerland

Grazing incidence X-ray ptychography is a promising technique for investigation of thin sub-monolayer filmsof nanoparticles. Preliminary results on a reconstruction of a test sample are presented.A potential impact for characterization of surface energy, particle size and growthdue to Ostwald ripening is expected

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